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Article

Plane Wave Imaging through Interfaces

1
Ultrasound Systems and Technology Group (GSTU), Institute for Physical and Information Technologies (ITEFI), Spanish National Research Council (CSIC), c/Serrano 144, 28006 Madrid, Spain
2
Non Destructive Testing Department, National Atomic Energy Commission (CNEA), Av. Gral. Paz 1499, Buenos Aires B1650, Argentina
3
Electronics Department, Escuela Politécnica, Universidad de Alcalá de Henares, Ctra. Madrid-Barcelona, Km. 33,600, 28805 Madrid, Spain
4
DASEL SL, Avda. del Cañal 44 Nave 3, 28500 Madrid, Spain
*
Author to whom correspondence should be addressed.
Academic Editor: Giacomo Oliveri
Sensors 2021, 21(15), 4967; https://doi.org/10.3390/s21154967
Received: 31 May 2021 / Revised: 8 July 2021 / Accepted: 9 July 2021 / Published: 21 July 2021
(This article belongs to the Special Issue Ultrasonic Imaging and Sensors)
Plane Wave Imaging (PWI) has been recently proposed for fast ultrasound inspections in the Non-Destructive-Testing (NDT) field. By using a single (or a reduced number) of plane wave emissions and parallel beamforming in reception, frame rates of hundreds to thousands of images per second can be achieved without significant image quality losses with regard to the Total Focusing Method (TFM) or Phased Array (PA). This work addresses the problem of applying PWI in the presence of arbitrarily shaped interfaces, which is a common problem in NDT. First, the mathematical formulation for generating a plane wave inside a component of arbitrary geometry is given, and the characteristics of the resultant acoustic field are analyzed by simulation, showing plane wavefronts with non-uniform amplitude. Then, an imaging strategy is proposed, accounting for this amplitude effect. Finally, the proposed method is experimentally validated, and its application limits are discussed. View Full-Text
Keywords: ultrasound imaging; phased array; total focusing method; plane wave imaging; non-destructive-testing ultrasound imaging; phased array; total focusing method; plane wave imaging; non-destructive-testing
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MDPI and ACS Style

Cosarinsky, G.; Fernandez-Cruza, J.; Camacho, J. Plane Wave Imaging through Interfaces. Sensors 2021, 21, 4967. https://doi.org/10.3390/s21154967

AMA Style

Cosarinsky G, Fernandez-Cruza J, Camacho J. Plane Wave Imaging through Interfaces. Sensors. 2021; 21(15):4967. https://doi.org/10.3390/s21154967

Chicago/Turabian Style

Cosarinsky, Guillermo, Jorge Fernandez-Cruza, and Jorge Camacho. 2021. "Plane Wave Imaging through Interfaces" Sensors 21, no. 15: 4967. https://doi.org/10.3390/s21154967

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