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Journal: Sensors, 2020
Volume: 20
Number: 2634
Article:
Effectiveness of Non-Local Means Algorithm with an Industrial 3 MeV LINAC High-Energy X-ray System for Non-Destructive Testing
Authors:
by
Kyuseok Kim, Jaegu Choi and Youngjin Lee
Link:
https://www.mdpi.com/1424-8220/20/9/2634
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