Dong, L.; Zhang, H.; Sun, S.; Zhu, L.; Cui, X.; Ghosh, B.K.
An Effective Simulation Analysis of Transient Electromagnetic Multiple Faults. Sensors 2020, 20, 1976.
https://doi.org/10.3390/s20071976
AMA Style
Dong L, Zhang H, Sun S, Zhu L, Cui X, Ghosh BK.
An Effective Simulation Analysis of Transient Electromagnetic Multiple Faults. Sensors. 2020; 20(7):1976.
https://doi.org/10.3390/s20071976
Chicago/Turabian Style
Dong, Liang, Hongxin Zhang, Shaofei Sun, Lei Zhu, Xiaotong Cui, and Bablu K. Ghosh.
2020. "An Effective Simulation Analysis of Transient Electromagnetic Multiple Faults" Sensors 20, no. 7: 1976.
https://doi.org/10.3390/s20071976
APA Style
Dong, L., Zhang, H., Sun, S., Zhu, L., Cui, X., & Ghosh, B. K.
(2020). An Effective Simulation Analysis of Transient Electromagnetic Multiple Faults. Sensors, 20(7), 1976.
https://doi.org/10.3390/s20071976