Yamada, J.; Inoue, T.; Nakamura, N.; Kameshima, T.; Yamauchi, K.; Matsuyama, S.; Yabashi, M.
X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors. Sensors 2020, 20, 7356.
https://doi.org/10.3390/s20247356
AMA Style
Yamada J, Inoue T, Nakamura N, Kameshima T, Yamauchi K, Matsuyama S, Yabashi M.
X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors. Sensors. 2020; 20(24):7356.
https://doi.org/10.3390/s20247356
Chicago/Turabian Style
Yamada, Jumpei, Takato Inoue, Nami Nakamura, Takashi Kameshima, Kazuto Yamauchi, Satoshi Matsuyama, and Makina Yabashi.
2020. "X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors" Sensors 20, no. 24: 7356.
https://doi.org/10.3390/s20247356
APA Style
Yamada, J., Inoue, T., Nakamura, N., Kameshima, T., Yamauchi, K., Matsuyama, S., & Yabashi, M.
(2020). X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors. Sensors, 20(24), 7356.
https://doi.org/10.3390/s20247356