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Journal: SensorsVolume: 20Number: 248
Article: High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis
  • Authors:
  • JeongHo BAEK1,†,
  • Eungyeong Lee1,† and
  • Nyunhee Kim1
  • et al.
Link: https://www.mdpi.com/1424-8220/20/1/248

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