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Journal: Sensors, 2020
Volume: 20
Number: 248
248
Article: High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis
Authors: by JeongHo BAEK, Eungyeong Lee, Nyunhee Kim, Song Lim Kim, Inchan Choi, Hyeonso Ji, Yong Suk Chung, Man-Soo Choi, Jung-Kyung Moon and Kyung-Hwan Kim
Link: https://www.mdpi.com/1424-8220/20/1/248

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