High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis
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BAEK, J.; Lee, E.; Kim, N.; Kim, S.L.; Choi, I.; Ji, H.; Chung, Y.S.; Choi, M.-S.; Moon, J.-K.; Kim, K.-H. High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis. Sensors 2020, 20, 248. https://doi.org/10.3390/s20010248
BAEK J, Lee E, Kim N, Kim SL, Choi I, Ji H, Chung YS, Choi M-S, Moon J-K, Kim K-H. High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis. Sensors. 2020; 20(1):248. https://doi.org/10.3390/s20010248
Chicago/Turabian StyleBAEK, JeongHo, Eungyeong Lee, Nyunhee Kim, Song L. Kim, Inchan Choi, Hyeonso Ji, Yong S. Chung, Man-Soo Choi, Jung-Kyung Moon, and Kyung-Hwan Kim. 2020. "High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis" Sensors 20, no. 1: 248. https://doi.org/10.3390/s20010248


