BAEK, J.; Lee, E.; Kim, N.; Kim, S.L.; Choi, I.; Ji, H.; Chung, Y.S.; Choi, M.-S.; Moon, J.-K.; Kim, K.-H.
High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis. Sensors 2020, 20, 248.
https://doi.org/10.3390/s20010248
AMA Style
BAEK J, Lee E, Kim N, Kim SL, Choi I, Ji H, Chung YS, Choi M-S, Moon J-K, Kim K-H.
High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis. Sensors. 2020; 20(1):248.
https://doi.org/10.3390/s20010248
Chicago/Turabian Style
BAEK, JeongHo, Eungyeong Lee, Nyunhee Kim, Song Lim Kim, Inchan Choi, Hyeonso Ji, Yong Suk Chung, Man-Soo Choi, Jung-Kyung Moon, and Kyung-Hwan Kim.
2020. "High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis" Sensors 20, no. 1: 248.
https://doi.org/10.3390/s20010248
APA Style
BAEK, J., Lee, E., Kim, N., Kim, S. L., Choi, I., Ji, H., Chung, Y. S., Choi, M.-S., Moon, J.-K., & Kim, K.-H.
(2020). High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis. Sensors, 20(1), 248.
https://doi.org/10.3390/s20010248