Article Versions Notes

Le Roch A, Goiffon V, Marcelot O, Paillet P, Pace F, Belloir J-M, Magnan P, Virmontois C. Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage. Sensors. 2019; 19(24):5550. https://doi.org/10.3390/s19245550

Le Roch, Alexandre, Vincent Goiffon, Olivier Marcelot, Philippe Paillet, Federico Pace, Jean-Marc Belloir, Pierre Magnan, and Cédric Virmontois. 2019. "Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage" Sensors 19, no. 24: 5550. https://doi.org/10.3390/s19245550

Le Roch, A., Goiffon, V., Marcelot, O., Paillet, P., Pace, F., Belloir, J.-M., Magnan, P., & Virmontois, C. (2019). Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage. Sensors, 19(24), 5550. https://doi.org/10.3390/s19245550