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Journal: Sensors, 2019
Volume: 19
Number: 4429

Article: Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing
Authors: by Piotr Kunicki, Tihomir Angelov, Tzvetan Ivanov, Teodor Gotszalk and Ivo Rangelow
Link: https://www.mdpi.com/1424-8220/19/20/4429

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