Support Vector Machine Optimized by Genetic Algorithm for Data Analysis of Near-Infrared Spectroscopy Sensors
AbstractNear-infrared (NIR) spectral sensors deliver the spectral response of the light absorbed by materials for quantification, qualification or identification. Spectral analysis technology based on the NIR sensor has been a useful tool for complex information processing and high precision identification in the tobacco industry. In this paper, a novel method based on the support vector machine (SVM) is proposed to discriminate the tobacco cultivation region using the near-infrared (NIR) sensors, where the genetic algorithm (GA) is employed for input subset selection to identify the effective principal components (PCs) for the SVM model. With the same number of PCs as the inputs to the SVM model, a number of comparative experiments were conducted between the effective PCs selected by GA and the PCs orderly starting from the first one. The model performance was evaluated in terms of prediction accuracy and four parameters of assessment criteria (true positive rate, true negative rate, positive predictive value and F1 score). From the results, it is interesting to find that some PCs with less information may contribute more to the cultivation regions and are considered as more effective PCs, and the SVM model with the effective PCs selected by GA has a superior discrimination capacity. The proposed GA-SVM model can effectively learn the relationship between tobacco cultivation regions and tobacco NIR sensor data. View Full-Text
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Wang, D.; Xie, L.; Yang, S.X.; Tian, F. Support Vector Machine Optimized by Genetic Algorithm for Data Analysis of Near-Infrared Spectroscopy Sensors. Sensors 2018, 18, 3222.
Wang D, Xie L, Yang SX, Tian F. Support Vector Machine Optimized by Genetic Algorithm for Data Analysis of Near-Infrared Spectroscopy Sensors. Sensors. 2018; 18(10):3222.Chicago/Turabian Style
Wang, Di; Xie, Lin; Yang, Simon X.; Tian, Fengchun. 2018. "Support Vector Machine Optimized by Genetic Algorithm for Data Analysis of Near-Infrared Spectroscopy Sensors." Sensors 18, no. 10: 3222.
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