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Journal: Sensors, 2017
Volume: 17
Number: 1800

Article: A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application
Authors: by Xuan Ye, Zhiguo Cui, Huajun Fang and Xide Li
Link: https://www.mdpi.com/1424-8220/17/8/1800

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