Lee, H.; Kim, M.S.; Jeong, D.; Delwiche, S.R.; Chao, K.; Cho, B.-K.
Detection of Cracks on Tomatoes Using a Hyperspectral Near-Infrared Reflectance Imaging System. Sensors 2014, 14, 18837-18850.
https://doi.org/10.3390/s141018837
AMA Style
Lee H, Kim MS, Jeong D, Delwiche SR, Chao K, Cho B-K.
Detection of Cracks on Tomatoes Using a Hyperspectral Near-Infrared Reflectance Imaging System. Sensors. 2014; 14(10):18837-18850.
https://doi.org/10.3390/s141018837
Chicago/Turabian Style
Lee, Hoonsoo, Moon S. Kim, Danhee Jeong, Stephen R. Delwiche, Kuanglin Chao, and Byoung-Kwan Cho.
2014. "Detection of Cracks on Tomatoes Using a Hyperspectral Near-Infrared Reflectance Imaging System" Sensors 14, no. 10: 18837-18850.
https://doi.org/10.3390/s141018837
APA Style
Lee, H., Kim, M. S., Jeong, D., Delwiche, S. R., Chao, K., & Cho, B.-K.
(2014). Detection of Cracks on Tomatoes Using a Hyperspectral Near-Infrared Reflectance Imaging System. Sensors, 14(10), 18837-18850.
https://doi.org/10.3390/s141018837