Lazar, J.; Klapetek, P.; Valtr, M.; Hrabina, J.; Buchta, Z.; Cip, O.; Cizek, M.; Oulehla, J.; Sery, M.
Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy. Sensors 2014, 14, 877-886.
https://doi.org/10.3390/s140100877
AMA Style
Lazar J, Klapetek P, Valtr M, Hrabina J, Buchta Z, Cip O, Cizek M, Oulehla J, Sery M.
Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy. Sensors. 2014; 14(1):877-886.
https://doi.org/10.3390/s140100877
Chicago/Turabian Style
Lazar, Josef, Petr Klapetek, Miroslav Valtr, Jan Hrabina, Zdenek Buchta, Onrej Cip, Martin Cizek, Jindrich Oulehla, and Mojmir Sery.
2014. "Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy" Sensors 14, no. 1: 877-886.
https://doi.org/10.3390/s140100877
APA Style
Lazar, J., Klapetek, P., Valtr, M., Hrabina, J., Buchta, Z., Cip, O., Cizek, M., Oulehla, J., & Sery, M.
(2014). Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy. Sensors, 14(1), 877-886.
https://doi.org/10.3390/s140100877
