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Journal: SensorsVolume: 14Number: 1528
Article: RTS Noise and Dark Current White Defects Reduction Using Selective Averaging Based on a Multi-Aperture System
  • Authors:
  • Bo Zhang*,
  • Keiichiro Kagawa and
  • Shoji Kawahito
  • et al.
Link: https://www.mdpi.com/1424-8220/14/1/1528

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