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Journal: Int. J. Mol. Sci., 2020
Volume: 21
Number: 1701
1701
Article: A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields
Authors: by Yusuke Matsuya, Toshiaki Nakano, Takeshi Kai, Naoya Shikazono, Ken Akamatsu, Yuji Yoshii and Tatsuhiko Sato
Link: https://www.mdpi.com/1422-0067/21/5/1701

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