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Journal: International Journal of Molecular SciencesVolume: 21Number: 1701
Article: A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields
  • Authors:
  • Yusuke Matsuya1,*,
  • Toshiaki Nakano2 and
  • Takeshi Kai1
  • et al.
Link: https://www.mdpi.com/1422-0067/21/5/1701

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