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Article

Genome Wide Association Study of Karnal Bunt Resistance in a Wheat Germplasm Collection from Afghanistan

1
ICAR- Indian Institute of Wheat and Barley Research, Karnal 132001, India
2
International Maize and Wheat Improvement Center (CIMMYT), Carretera México-Veracruz Km. 45, El Batán, Texcoco, CP 56237, Mexico
3
ICAR- Indian Agricultural Research Institute, New Delhi 110012, India
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INIFAP-CIRNO, Campo Experimental Norman E. Borlaug, Apdo. Postal 155, Km 12 Norman E. Borlaug, Cd. Obregon, Sonora, CP 85000, Mexico
5
Agricultural Research Institute of Afghanistan (ARIA), Kabul 1001, Afghanistan
*
Author to whom correspondence should be addressed.
Int. J. Mol. Sci. 2019, 20(13), 3124; https://doi.org/10.3390/ijms20133124
Received: 3 June 2019 / Revised: 23 June 2019 / Accepted: 25 June 2019 / Published: 26 June 2019
(This article belongs to the Special Issue Mapping Plant Genes that Confer Resistance to Biotic Stress)
Karnal bunt disease of wheat, caused by the fungus Neovossia indica, is one of the most important challenges to the grain industry as it affects the grain quality and also restricts the international movement of infected grain. It is a seed-, soil- and airborne disease with limited effect of chemical control. Currently, this disease is contained through the deployment of host resistance but further improvement is limited as only a few genotypes have been found to carry partial resistance. To identify genomic regions responsible for resistance in a set of 339 wheat accessions, genome-wide association study (GWAS) was undertaken using the DArTSeq® technology, in which 18 genomic regions for Karnal bunt resistance were identified, explaining 5–20% of the phenotypic variation. The identified quantitative trait loci (QTL) on chromosome 2BL showed consistently significant effects across all four experiments, whereas another QTL on 5BL was significant in three experiments. Additional QTLs were mapped on chromosomes 1DL, 2DL, 4AL, 5AS, 6BL, 6BS, 7BS and 7DL that have not been mapped previously, and on chromosomes 4B, 5AL, 5BL and 6BS, which have been reported in previous studies. Germplasm with less than 1% Karnal bunt infection have been identified and can be used for resistance breeding. The SNP markers linked to the genomic regions conferring resistance to Karnal bunt could be used to improve Karnal bunt resistance through marker-assisted selection. View Full-Text
Keywords: Karnal bunt; Neovossia indica; Resistance breeding; SNPs; Triticum aestivum Karnal bunt; Neovossia indica; Resistance breeding; SNPs; Triticum aestivum
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MDPI and ACS Style

Gupta, V.; He, X.; Kumar, N.; Fuentes-Davila, G.; Sharma, R.K.; Dreisigacker, S.; Juliana, P.; Ataei, N.; Singh, P.K. Genome Wide Association Study of Karnal Bunt Resistance in a Wheat Germplasm Collection from Afghanistan. Int. J. Mol. Sci. 2019, 20, 3124. https://doi.org/10.3390/ijms20133124

AMA Style

Gupta V, He X, Kumar N, Fuentes-Davila G, Sharma RK, Dreisigacker S, Juliana P, Ataei N, Singh PK. Genome Wide Association Study of Karnal Bunt Resistance in a Wheat Germplasm Collection from Afghanistan. International Journal of Molecular Sciences. 2019; 20(13):3124. https://doi.org/10.3390/ijms20133124

Chicago/Turabian Style

Gupta, Vikas, Xinyao He, Naresh Kumar, Guillermo Fuentes-Davila, Rajiv K. Sharma, Susanne Dreisigacker, Philomin Juliana, Najibeh Ataei, and Pawan K. Singh 2019. "Genome Wide Association Study of Karnal Bunt Resistance in a Wheat Germplasm Collection from Afghanistan" International Journal of Molecular Sciences 20, no. 13: 3124. https://doi.org/10.3390/ijms20133124

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