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Journal: Entropy, 2018
Volume: 20
Number: 604
Article:
Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE
Authors:
by
Wei He, Yigang He, Bing Li and Chaolong Zhang
Link:
https://www.mdpi.com/1099-4300/20/8/604
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