Topic Editors




Modeling, Fabrication, and Characterization of Semiconductor Materials and Devices, 2nd Edition
Topic Information
Dear Colleagues,
We invite submissions to this Topic related to Semiconductor Materials and Devices, which is a continuation of a successful previous Topic (https://www.mdpi.com/topics/0C4NK7X837).
Semiconductor devices are central to the modern digital economy, being used in areas ranging from smartphones and cars to critical applications and infrastructures for healthcare, energy, mobility, communications and industrial automation. They are crucial for the development of future technologies, such as artificial intelligence (AI), 5G communications and computing. The semiconductor field is one of the most fast-paced areas of research and development. Therefore, determining the right set of processes, selecting the right chemicals and materials, and employing cutting-edge data analytics software and the most reliable technology solutions are essential for its over-expanding success and for reinvestment back into the R&D cycle.
For almost 50 years, the International Semiconductors Conference (https://www.imt.ro/cas) has tackled different aspects of the semiconductor value chain, considering both semiconductor electronics and micro-and nanotechnologies (including micro- and nanosystems). Conference participants, as well as relevant scholars (non-participants), are welcome to contribute papers to this Special Issue.
Topics of interest for this Special Issue include (but are not limited to) the following:
- Nanoscience and nanoengineering;
- Micro- and nanophotonics and optoelectronics;
- Micro- and millimeter-wave circuits and systems;
- Microsensors and microsystems;
- Modeling;
- Semiconductor devices;
- Integrated circuits.
Dr. Ana-Maria Lepadatu
Dr. Andrei Avram
Dr. Martino Aldrigo
Dr. Florin Nastase
Topic Editors
Keywords
- micro- and nanotechnologies
- semiconductor devices modeling
- simulation
- micro- and nanophotonics
- optoelectronics
Participating Journals
Journal Name | Impact Factor | CiteScore | Launched Year | First Decision (median) | APC | |
---|---|---|---|---|---|---|
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Coatings
|
2.9 | 5.0 | 2011 | 14.5 Days | CHF 2600 | Submit |
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Electronics
|
2.6 | 5.3 | 2012 | 16.4 Days | CHF 2400 | Submit |
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Journal of Sensor and Actuator Networks
|
3.3 | 7.9 | 2012 | 19 Days | CHF 2000 | Submit |
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Nanomaterials
|
4.4 | 8.5 | 2010 | 14.1 Days | CHF 2400 | Submit |
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Sensors
|
3.4 | 7.3 | 2001 | 18.6 Days | CHF 2600 | Submit |
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