- Article
Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics
- Jawad Yousaf,
- Doojin Lee,
- JunHee Han,
- Hosang Lee,
- Muhammad Faisal,
- Jeongeun Kim and
- Wansoo Nah
This study presents a near-field immunity test (NFIT) method for the fast debugging of radiated susceptibility of industrial devices. The proposed approach is based on the development of an NFIT setup which comprises of developed near-field electric...