Sign in to use this feature.

Years

Between: -

Subjects

remove_circle_outline
remove_circle_outline
remove_circle_outline
remove_circle_outline
remove_circle_outline
remove_circle_outline
remove_circle_outline

Journals

Article Types

Countries / Regions

Search Results (72)

Search Parameters:
Keywords = Anisotropic etching

Order results
Result details
Results per page
Select all
Export citation of selected articles as:
32 pages, 3631 KB  
Article
Physics-Based Simulation of Master Template Fabrication: Integrated Modeling of Resist Coating, Electron Beam Lithography, and Reactive Ion Etching
by Jean Chien, Lily Chuang and Eric Lee
Electronics 2025, 14(23), 4751; https://doi.org/10.3390/electronics14234751 - 2 Dec 2025
Viewed by 484
Abstract
Nanoimprint lithography (NIL) master fidelity is governed by coupled variations beginning with resist spin-coating, proceeding through electron beam exposure, and culminating in anisotropic etch transfer. We present an integrated, physics-based simulation chain. First, it includes a spin-coating thickness model that combines Emslie–Meyerhofer scaling [...] Read more.
Nanoimprint lithography (NIL) master fidelity is governed by coupled variations beginning with resist spin-coating, proceeding through electron beam exposure, and culminating in anisotropic etch transfer. We present an integrated, physics-based simulation chain. First, it includes a spin-coating thickness model that combines Emslie–Meyerhofer scaling with a Bornside edge correction. The simulated wafer-scale map at 4000 rpm exhibits the canonical center-rise and edge-bead profile with a 0.190–0.206 μm thickness range, while the locally selected 600 nm × 600 nm tile shows <0.1 nm variation, confirming an effectively uniform region for downstream analysis. Second, it couples an e-beam lithography (EBL) module in which column electrostatics and trajectory-derived spot size feed a hybrid Gaussian–Lorentzian proximity kernel; under typical operating conditions (σtraj ≈ 2–5 nm), the model yields low CD bias (ΔCD = 2.38/2.73 nm), controlled LER (2.18/4.90 nm), and stable NMSE (1.02/1.05) for isolated versus dense patterns. Finally, the exposure result is passed to a level set reactive ion etching (RIE) model with angular anisotropy and aspect ratio-dependent etching (ARDE), which reproduces density-dependent CD shrinkage trends (4.42% versus 7.03%) consistent with transport-limited profiles in narrow features. Collectively, the simulation chain accounts for stage-to-stage propagation—from spin-coating thickness variation and EBL proximity to ARDE-driven etch behavior—while reporting OPC-aligned metrics such as NMSE, ΔCD, and LER. In practice, mask process correction (MPC) is necessary rather than optional: the simulator provides the predictive model, metrology supplies updates, and constrained optimization sets dose, focus, and etch set-points under CD/LER requirements. Full article
Show Figures

Figure 1

12 pages, 3385 KB  
Article
Advanced BCl3-Driven Deep Ion Etching of β-Ga2O3 for Precision High-Aspect-Ratio Nanostructures
by Badriyah Alhalaili
Sensors 2025, 25(21), 6609; https://doi.org/10.3390/s25216609 - 27 Oct 2025
Viewed by 1063
Abstract
Gallium oxide-based devices are critical in various applications, including industrial safety, the gas and petroleum sectors, and research environments. However, the deep etching process has not been thoroughly explored. Key parameters such as etching rate, selectivity, uniformity, isotropic/anisotropic behavior, and surface properties all [...] Read more.
Gallium oxide-based devices are critical in various applications, including industrial safety, the gas and petroleum sectors, and research environments. However, the deep etching process has not been thoroughly explored. Key parameters such as etching rate, selectivity, uniformity, isotropic/anisotropic behavior, and surface properties all influence the effectiveness of the etching process and its reproducibility. This research was motivated by the need for efficient fabrication processes, particularly in applications where sensors must operate in harsh environments, due to their instead of owning to low leakage current density of their power devices. In this study, we studied a deep etching technique for Ga2O3, focusing on the chemical stability of the two planes and identifying suitable protocols that could enhance etching depth via a dry-etching process. A deep ion-etching process for Ga2O3 was successfully developed, achieving deep etches of 6.97 µm in the Ga2O3. These advancements pave the way for high-aspect-ratio Ga2O3 nanostructures, offering new possibilities for robust nanosensors in harsh environments. Full article
Show Figures

Figure 1

14 pages, 3123 KB  
Article
A Highly Sensitive Silicon Nanowire Array Field Effect Transistor Biosensor for Detecting HBV-DNA and AFP
by Peng Sun, Mingbin Liu, Yongxin Zhang, Chaoran Liu and Xun Yang
Sensors 2025, 25(20), 6385; https://doi.org/10.3390/s25206385 - 16 Oct 2025
Viewed by 940
Abstract
Chronic hepatitis B poses a serious threat to human health and life, and early diagnosis is essential to improving patient cure rates. Hepatitis B virus (HBV) and Alpha-fetoprotein (AFP) are two key biomarkers for diagnosing chronic hepatitis B. In this study, we propose [...] Read more.
Chronic hepatitis B poses a serious threat to human health and life, and early diagnosis is essential to improving patient cure rates. Hepatitis B virus (HBV) and Alpha-fetoprotein (AFP) are two key biomarkers for diagnosing chronic hepatitis B. In this study, we propose a silicon nanowire array field effect transistor (SiNW-array FET) biosensor that enables highly sensitive, real-time, and low-cost joint detection of both HBV and AFP. The SiNW-array FET is fabricated using traditional micro-nano fabrication techniques such as self-limiting oxidation and anisotropic etching, and its morphology and electrical properties were tested. The results show that the diameters of the fabricated silicon nanowires (SiNWs) are uniform and the SiNW-array FET exhibits a strong output signal and high signal-to-noise ratio. Through specific chemical modification on the surface of SiNWs, the SiNW-array FET is highly sensitive and specific to HBV-DNA fragments and AFP, with ultralow detection limits of 0.1 fM (HBV-DNA) and 0.1 fg/mL (AFP). The detection curve of the SiNW-array FET exhibits good linearity within the HBV-DNA concentration range of 0.1 fM to 100 pM and AFP concentration range of 0.1 fg/mL to 1000 pg/mL. More importantly, the device could also detect HBV-DNA successfully in serum samples, laying a solid foundation for the highly sensitive clinical detection of chronic hepatitis B. Full article
(This article belongs to the Special Issue Advanced Nanogenerators for Micro-Energy and Self-Powered Sensors)
Show Figures

Figure 1

12 pages, 5501 KB  
Article
Statistical Analysis of the Spatial Distribution of InAl Droplet-Etched Nanoholes in In0.52Al0.48As Layers
by Normen Auler, Dennis Deutsch and Dirk Reuter
Crystals 2025, 15(9), 770; https://doi.org/10.3390/cryst15090770 - 29 Aug 2025
Cited by 1 | Viewed by 649
Abstract
By analyzing atomic force microscopy images, we studied the spatial distribution of nanoholes etched by InAl droplets in In0.52Al0.48As surfaces, employing molecular beam epitaxy. We identified two temperature regimes, which exhibit significantly different droplet aggregation behavior. The droplet density [...] Read more.
By analyzing atomic force microscopy images, we studied the spatial distribution of nanoholes etched by InAl droplets in In0.52Al0.48As surfaces, employing molecular beam epitaxy. We identified two temperature regimes, which exhibit significantly different droplet aggregation behavior. The droplet density shows an exponential decrease with increasing temperature in the low-temperature regime (300–390 °C), which is characterized by an activation energy of 0.34 eV, whereas for the high-temperature regime (435–505 °C), the exponential decrease persists but with a much larger activation energy of 2.20 eV. The increased activation energy is accompanied by a strong elongation of the denuded zone around the nanoholes in the distribution of the nearest neighbors along the [011] direction, whereas the distribution is almost isotropic in the low-temperature regime. In both temperature regimes, we observe a narrowing of the capture-zone size distribution with increasing temperature; however, the distribution broadens with the transition to the high-temperature regime before narrowing again with further increasing temperature. By employing nucleation theory, we find that the critical nucleus size does not appear to be significantly different between the two temperature regimes. However, Ostwald ripening is probably relevant, so nucleation theory does not describe our experiments completely. We propose a change in the surface reconstruction, with a more anisotropic arrangement in the high-temperature regime as the underlying reason for the significantly different behavior in the two regimes. Full article
(This article belongs to the Section Inorganic Crystalline Materials)
Show Figures

Figure 1

19 pages, 7062 KB  
Article
Formation of Black Silicon in a Process of Plasma Etching with Passivation in a SF6/O2 Gas Mixture
by Andrey Miakonkikh and Vitaly Kuzmenko
Nanomaterials 2024, 14(11), 945; https://doi.org/10.3390/nano14110945 - 28 May 2024
Cited by 9 | Viewed by 3589
Abstract
This article discusses a method for forming black silicon using plasma etching at a sample temperature range from −20 °C to +20 °C in a mixture of oxygen and sulfur hexafluoride. The surface morphology of the resulting structures, the autocorrelation function of surface [...] Read more.
This article discusses a method for forming black silicon using plasma etching at a sample temperature range from −20 °C to +20 °C in a mixture of oxygen and sulfur hexafluoride. The surface morphology of the resulting structures, the autocorrelation function of surface features, and reflectivity were studied depending on the process parameters—the composition of the plasma mixture, temperature and other discharge parameters (radical concentrations). The relationship between these parameters and the concentrations of oxygen and fluorine radicals in plasma is shown. A novel approach has been studied to reduce the reflectance using conformal bilayer dielectric coatings deposited by atomic layer deposition. The reflectivity of the resulting black silicon was studied in a wide spectral range from 400 to 900 nm. As a result of the research, technologies for creating black silicon on silicon wafers with a diameter of 200 mm have been proposed, and the structure formation process takes no more than 5 min. The resulting structures are an example of the self-formation of nanostructures due to anisotropic etching in a gas discharge plasma. This material has high mechanical, chemical and thermal stability and can be used as an antireflective coating, in structures requiring a developed surface—photovoltaics, supercapacitors, catalysts, and antibacterial surfaces. Full article
(This article belongs to the Special Issue Synthesis of Nanostructures in Gas-Discharge Plasma)
Show Figures

Figure 1

14 pages, 5054 KB  
Article
Piezoelectric Micromachined Ultrasonic Transducers with Micro-Hole Inter-Etch and Sealing Process on (111) Silicon Wafer
by Yunhao Wang, Sheng Wu, Wenjing Wang, Tao Wu and Xinxin Li
Micromachines 2024, 15(4), 482; https://doi.org/10.3390/mi15040482 - 30 Mar 2024
Cited by 5 | Viewed by 5822
Abstract
Piezoelectric micromachined ultrasound transducers (PMUTs) have gained significant popularity in the field of ultrasound ranging and medical imaging owing to their small size, low power consumption, and affordability. The scar-free “MIS” (micro-hole inter-etch and sealing) process, a novel bulk-silicon manufacturing technique, has been [...] Read more.
Piezoelectric micromachined ultrasound transducers (PMUTs) have gained significant popularity in the field of ultrasound ranging and medical imaging owing to their small size, low power consumption, and affordability. The scar-free “MIS” (micro-hole inter-etch and sealing) process, a novel bulk-silicon manufacturing technique, has been successfully developed for the fabrication of pressure sensors, flow sensors, and accelerometers. In this study, we utilize the MIS process to fabricate cavity diaphragm structures for PMUTs, resulting in the formation of a flat cavity diaphragm structure through anisotropic etching of (111) wafers in a 70 °C tetramethylammonium hydroxide (TMAH) solution. This study investigates the corrosion characteristics of the MIS technology on (111) silicon wafers, arranges micro-pores etched on bulk silicon around the desired cavity structure in a regular pattern, and takes into consideration the distance compensation for lateral corrosion, resulting in a fully connected cavity structure closely approximating an ortho-hexagonal shape. By utilizing a sputtering process to deposit metallic molybdenum as upper and lower electrodes, as well as piezoelectric materials above the cavity structure, we have successfully fabricated aluminum nitride (AlN) piezoelectric ultrasonic transducer arrays of various sizes and structures. The final hexagonal PMUT cells of various sizes that were fabricated achieved a maximum quality factor (Q) of 251 and a displacement sensitivity of 18.49 nm/V across a range of resonant frequencies from 6.28 MHz to 11.99 MHz. This fabrication design facilitates the achievement of IC-compatible and cost-effective mass production of PMUT array devices with high resonance frequencies. Full article
(This article belongs to the Section A:Physics)
Show Figures

Figure 1

10 pages, 2516 KB  
Article
Controlling Bowing and Narrowing in SiO2 Contact-Hole Etch Profiles Using Heptafluoropropyl Methyl Ether as an Etchant with Low Global Warming Potential
by Sanghyun You, Hyun Seok Yang, Dongjun Jeon, Heeyeop Chae and Chang-Koo Kim
Coatings 2023, 13(8), 1452; https://doi.org/10.3390/coatings13081452 - 17 Aug 2023
Cited by 1 | Viewed by 2928
Abstract
Heptafluoropropyl methyl ether (HFE-347mcc3), as a lower-GWP (global warming potential) alternative to PFCs (perfluorocarbons), was used to etch SiO2 contact holes. The etch profiles of the SiO2 contact holes in HFE-347mcc3/O2/Ar plasmas showed more bowing at lower flow rate [...] Read more.
Heptafluoropropyl methyl ether (HFE-347mcc3), as a lower-GWP (global warming potential) alternative to PFCs (perfluorocarbons), was used to etch SiO2 contact holes. The etch profiles of the SiO2 contact holes in HFE-347mcc3/O2/Ar plasmas showed more bowing at lower flow rate ratios of HFE-347mcc3 to Ar, whereas more narrowing occurred at higher ratios. The measurements of the angular dependences of the deposition rates of fluorocarbon films on the surface of SiO2 and the etch rates of SiO2 showed that the shape evolution of contact-hole etch profiles at different HFE-347mcc3/Ar ratios was attributed to an increase in etch resistance and a decrease in etch ability of the sidewalls of the contact hole with the increasing HFE-347mcc3/Ar ratio. This resulted in determining the optimum ratio of HFE-347mcc3 to Ar to achieve the maximum anisotropy of the contact hole etched in HFE-347mcc3/O2/Ar plasmas. By carefully selecting the specific flow rates of HFE-347mcc3/O2/Ar (9/2/19 sccm), a highly anisotropic and bowing-free SiO2 contact hole, with a 100 nm diameter and an aspect ratio of 24, was successfully achieved. Full article
(This article belongs to the Special Issue Electron-Ion-Plasma Technology Applied to Surface Engineering)
Show Figures

Figure 1

14 pages, 8911 KB  
Article
Characterization of Chiral Nanostructured Surfaces Made via Colloidal Lithography
by Sabine Portal, Carles Corbella, Oriol Arteaga, Alexander Martin, Trinanjana Mandal and Bart Kahr
Nanomaterials 2023, 13(15), 2235; https://doi.org/10.3390/nano13152235 - 2 Aug 2023
Cited by 1 | Viewed by 2005
Abstract
Optically anisotropic materials were produced via colloidal lithography and characterized using scanning electronic microscopy (SEM), confocal microscopy, and polarimetry. A compact hexagonal array mask composed of silica sub-micron particles was fabricated via the Langmuir–Blodgett self-assembly technique. Subsequently, the mask pattern was transferred onto [...] Read more.
Optically anisotropic materials were produced via colloidal lithography and characterized using scanning electronic microscopy (SEM), confocal microscopy, and polarimetry. A compact hexagonal array mask composed of silica sub-micron particles was fabricated via the Langmuir–Blodgett self-assembly technique. Subsequently, the mask pattern was transferred onto monocrystalline silicon and commercial glass substrates using ion beam etching in a vacuum. Varying the azimuthal angle while etching at oblique incidence carved screw-like shaped pillars into the substrates, resulting in heterochiral structures depending on the azimuthal angle direction. To enhance the material’s optical properties through plasmon resonance, gold films were deposited onto the pillars. Polarimetric measurements were realized at normal and oblique incidences, showing that the etching directions have a clear influence on the value of the linear birefringence and linear dichroism. The polarimetric properties, especially the chiroptical responses, increased with the increase in the angle of incidence. Full article
Show Figures

Figure 1

13 pages, 4305 KB  
Article
Anisotropic Analysis of Etch Rates for Sapphire Based on a Layer-by-Layer Removal Model of Surface Atoms
by Yang Li and Guorong Wu
Processes 2023, 11(4), 1290; https://doi.org/10.3390/pr11041290 - 21 Apr 2023
Cited by 1 | Viewed by 3161
Abstract
In this paper, a layer-by-layer removal model of surface atoms (Al) is established according to the atomic structure of sapphire, which can accurately calculate etch rates of crystal planes and analyze the anisotropy of etch rates of sapphire. Firstly, etch rate distributions of [...] Read more.
In this paper, a layer-by-layer removal model of surface atoms (Al) is established according to the atomic structure of sapphire, which can accurately calculate etch rates of crystal planes and analyze the anisotropy of etch rates of sapphire. Firstly, etch rate distributions of sapphire are gained through different etching experiments of sapphire hemispheres, and the effect of concentrations of the etching solution on etch rate distributions are analyzed. Then, different types of surface atoms are classified based on the types of chemical bonds of surface atoms, the arrangement laws of surface atoms of different crystal planes are analyzed and a general formula for calculating etch rates of different planes is proposed. Finally, the effectiveness of the layer-by-layer removal model of surface atoms (Al) is proved by small errors between calculated rates of the model and experimental rates at different concentrations, and the factors affecting the anisotropy of etch rates of sapphire are summarized, which include: (1) the vertical distances between two adjacent layers of surface atoms of crystal planes; (2) the configurations of the types of surface atoms of crystal planes. Full article
(This article belongs to the Section Materials Processes)
Show Figures

Graphical abstract

12 pages, 53403 KB  
Article
Anisotropic Etching of InGaN Thin Films with Photoelectrochemical Etching to Form Quantum Dots
by Xiongliang Wei, Syed Ahmed Al Muyeed, Haotian Xue and Jonathan J. Wierer
Materials 2023, 16(5), 1890; https://doi.org/10.3390/ma16051890 - 24 Feb 2023
Viewed by 2491
Abstract
Traditional methods for synthesizing InGaN quantum dots (QDs), such as the Stranski-Krastanov growth, often result in QD ensembles with low density and non-uniform size distribution. To overcome these challenges, forming QDs using photoelectrochemical (PEC) etching with coherent light has been developed. Anisotropic etching [...] Read more.
Traditional methods for synthesizing InGaN quantum dots (QDs), such as the Stranski-Krastanov growth, often result in QD ensembles with low density and non-uniform size distribution. To overcome these challenges, forming QDs using photoelectrochemical (PEC) etching with coherent light has been developed. Anisotropic etching of InGaN thin films is demonstrated here with PEC etching. InGaN films are etched in dilute H2SO4 and exposed to a pulsed 445 nm laser with a 100 mW/cm2 average power density. Two potentials (0.4 V or 0.9 V) measured with respect to an AgCl|Ag reference electrode are applied during PEC etching, resulting in different QDs. Atomic force microscope images show that while the QD density and sizes are similar for both applied potentials, the heights are more uniform and match the initial InGaN thickness at the lower applied potential. Schrodinger-Poisson simulations show that polarization-induced fields in the thin InGaN layer prevent positively charged carriers (holes) from arriving at the c-plane surface. These fields are mitigated in the less polar planes resulting in high etch selectivity for the different planes. The higher applied potential overcomes the polarization fields and breaks the anisotropic etching. Full article
(This article belongs to the Special Issue Quantum Dots for Optoelectronic Devices)
Show Figures

Figure 1

14 pages, 5026 KB  
Article
Fabrication of Substrate-Integrated Waveguide Using Micromachining of Photoetchable Glass Substrate for 5G Millimeter-Wave Applications
by Seung-Han Chung, Jae-Hyun Shin, Yong-Kweon Kim and Chang-Wook Baek
Micromachines 2023, 14(2), 288; https://doi.org/10.3390/mi14020288 - 22 Jan 2023
Cited by 5 | Viewed by 5572
Abstract
A millimeter-wave substrate-integrated waveguide (SIW) was firstly demonstrated using the micromachining of photoetchable glass (PEG) for 5G applications. A PEG substrate was used as a dielectric material of the SIW, and its photoetchable properties were used to fabricate through glass via (TGV) holes. [...] Read more.
A millimeter-wave substrate-integrated waveguide (SIW) was firstly demonstrated using the micromachining of photoetchable glass (PEG) for 5G applications. A PEG substrate was used as a dielectric material of the SIW, and its photoetchable properties were used to fabricate through glass via (TGV) holes. Instead of the conventional metallic through glass via (TGV) array structures that are typically used for the SIW, two continuous empty TGV holes with metallized sidewalls connecting the top metal layer to the bottom ground plane were used as waveguide walls. The proposed TGV walls were fabricated by using optical exposure, heat development and anisotropic HF (hydrofluoric acid) etching of the PEG substrate, followed by a metal sputtering technique. The SIW was fed by microstrip lines connected to the waveguide through tapered microstrip-to-waveguide transitions. The top metal layer, including these feedlines and transitions, was fabricated by selective metal sputtering through a silicon shadow mask, which was prefabricated by a silicon deep-reactive ion-etching (DRIE) technique. The developed PEG-based process provides a relatively simple, wafer-level manufacturing method to fabricate the SIW in a low-cost glass dielectric substrate, without the formation of individual of TGV holes, complex time-consuming TGV filling processes and repeated photolithographic steps. The fabricated SIW had a dimension of 6 × 10 × 0.42 mm3 and showed an average insertion loss of 2.53 ± 0.55 dB in the Ka-band frequency range from 26.5 GHz to 40 GHz, with a return loss better than 13.86 dB. The proposed process could be used not only for SIW-based devices, but also for various millimeter-wave applications where a glass substrate with TGV structures is required. Full article
(This article belongs to the Special Issue Microwave Passive Components)
Show Figures

Figure 1

11 pages, 4373 KB  
Article
Monodisperse Micro-Droplet Generation in Microfluidic Channel with Asymmetric Cross-Sectional Shape
by Youngseo Cho, Jungwoo Kim, Jaewon Park, Hyun Soo Kim and Younghak Cho
Micromachines 2023, 14(1), 223; https://doi.org/10.3390/mi14010223 - 15 Jan 2023
Cited by 5 | Viewed by 4278
Abstract
Micro-droplets are widely used in the fields of chemical and biological research, such as drug delivery, material synthesis, point-of-care diagnostics, and digital PCR. Droplet-based microfluidics has many advantages, such as small reagent consumption, fast reaction time, and independent control of each droplet. Therefore, [...] Read more.
Micro-droplets are widely used in the fields of chemical and biological research, such as drug delivery, material synthesis, point-of-care diagnostics, and digital PCR. Droplet-based microfluidics has many advantages, such as small reagent consumption, fast reaction time, and independent control of each droplet. Therefore, various micro-droplet generation methods have been proposed, including T-junction breakup, capillary flow-focusing, planar flow-focusing, step emulsification, and high aspect (height-to-width) ratio confinement. In this study, we propose a microfluidic device for generating monodisperse micro-droplets, the microfluidic channel of which has an asymmetric cross-sectional shape and high hypotenuse-to-width ratio (HTWR). It was fabricated using basic MEMS processes, such as photolithography, anisotropic wet etching of Si, and polydimethylsiloxane (PDMS) molding. Due to the geometric similarity of a Si channel and a PDMS mold, both of which were created through the anisotropic etching process of a single crystal Si, the microfluidic channel with the asymmetric cross-sectional shape and high HTWR was easily realized. The effects of HTWR of channels on the size and uniformity of generated micro-droplets were investigated. The monodisperse micro-droplets were generated as the HTWR of the asymmetric channel was over 3.5. In addition, it was found that the flow direction of the oil solution (continuous phase) affected the size of micro-droplets due to the asymmetric channel structures. Two kinds of monodisperse droplets with different sizes were successfully generated for a wider range of flow rates using the asymmetric channel structure in the developed microfluidic device. Full article
(This article belongs to the Special Issue Droplet Microfluidics: Fundamentals and Its Advanced Applications)
Show Figures

Figure 1

16 pages, 4238 KB  
Article
Nanosphere Lithography-Based Fabrication of Spherical Nanostructures and Verification of Their Hexagonal Symmetries by Image Analysis
by Mária Domonkos and Alexander Kromka
Symmetry 2022, 14(12), 2642; https://doi.org/10.3390/sym14122642 - 14 Dec 2022
Cited by 16 | Viewed by 4983
Abstract
Nanosphere lithography (NSL) is a cost- and time-effective technique for the fabrication of well-ordered large-area arrays of nanostructures. This paper reviews technological challenges in NSL mask preparation, its modification, and quality control. Spin coating with various process parameters (substrate wettability, solution properties, spin [...] Read more.
Nanosphere lithography (NSL) is a cost- and time-effective technique for the fabrication of well-ordered large-area arrays of nanostructures. This paper reviews technological challenges in NSL mask preparation, its modification, and quality control. Spin coating with various process parameters (substrate wettability, solution properties, spin coating operating parameters) are discussed to create a uniform monolayer from monodisperse polystyrene (PS) nanospheres with a diameter of 0.2–1.5 μm. Scanning electron microscopy images show that the PS nanospheres are ordered into a hexagonal close-packed monolayer. Verification of sphere ordering and symmetry is obtained using our open-source software HEXI, which can recognize and detect circles, and distinguish between hexagonal ordering and defect configurations. The created template is used to obtain a wide variety of tailor-made periodic structures by applying additional treatments, such as plasma etching (isotropic and anisotropic), deposition, evaporation, and lift-off. The prepared highly ordered nanopatterned arrays (from circular, triangular, pillar-shaped structures) are applicable in many different fields (plasmonics, photonics, sensorics, biomimetic surfaces, life science, etc.). Full article
(This article belongs to the Special Issue Symmetry in Physics of Plasma Technologies II)
Show Figures

Figure 1

12 pages, 3024 KB  
Article
Microfluidic Liquid Cell with Silicon Nitride Super-Thin Membrane for Electron Microscopy of Samples in Liquid
by Akihiko Sugihara and Tadashi Ishida
Biosensors 2022, 12(12), 1138; https://doi.org/10.3390/bios12121138 - 7 Dec 2022
Cited by 3 | Viewed by 3292
Abstract
Microfluidic liquid cells have been developed to visualize nanoscaled biological samples in liquid using a scanning electron microscope (SEM) through an electron-transparent membrane (ETM). However, despite the combination of the high-resolution visualization of SEM and the high experimental capability of microfluidics, the image [...] Read more.
Microfluidic liquid cells have been developed to visualize nanoscaled biological samples in liquid using a scanning electron microscope (SEM) through an electron-transparent membrane (ETM). However, despite the combination of the high-resolution visualization of SEM and the high experimental capability of microfluidics, the image is unclear because of the scattering of the electron beam in the ETM. Thus, this study developed a microfluidic liquid cell with a super-thin ETM of thickness 10 nm. Because the super-thin ETM is excessively fragile, the bonding of a silicon–nitride-deposited substrate and a polydimethylsiloxane microchannel before silicon anisotropic etching was proposed prevented the super-thin ETM from damage and breakage due to etching. With this protection against etchant using the microchannel, the yield of the fabricated super-thin ETM increased from 0 to 87%. Further, the scattering of the electron beam was suppressed using a microfluidic liquid cell with a super-thin ETM, resulting in high-resolution visualization. In addition, T4 bacteriophages were visualized using a super-thin ETM in vacuum. Furthermore, the cyanobacterium Synechocystis sp. PCC6803 in liquid was visualized using a super-thin ETM, and sub-microscopic structures on the surface were observed. Full article
(This article belongs to the Special Issue Microfluidics for Detection and Analysis)
Show Figures

Figure 1

12 pages, 2973 KB  
Article
Miniature Mesa Extension for a Planar Submicron AlGaN/GaN HEMT Gate Formation
by Moath Alathbah and Khaled Elgaid
Micromachines 2022, 13(11), 2007; https://doi.org/10.3390/mi13112007 - 18 Nov 2022
Cited by 2 | Viewed by 4457
Abstract
In this letter, a novel approach is presented to overcome issues in AlGaN/GaN high electron mobility transistors (HEMTs), such as metal discontinuity of the gate stemmed from conventional mesa isolation. This usually requires a careful mesa etch process to procure an anisotropic mesa-wall [...] Read more.
In this letter, a novel approach is presented to overcome issues in AlGaN/GaN high electron mobility transistors (HEMTs), such as metal discontinuity of the gate stemmed from conventional mesa isolation. This usually requires a careful mesa etch process to procure an anisotropic mesa-wall profile. An alternative technique is the use of ion implantation for device isolation instead of conventional mesa for a planar device formation. However, ion implantation is a costly process and not always easily accessible. In this work, the proposed method is to simply extend the mesa below the gate just enough to accommodate the gatefeed, thereby ensuring the entire gate is planar in structure up to the gatefeed. The newly developed device exhibited no compromise to the DC (direct current) and RF (radio frequency) performance. Conversely, it produced a planar gate configuration with an enhanced DC transconductance (approximately 20% increase is observed) and a lower gate leakage while the etch process is considerably simplified. Similarly, the RF transconductance of proposed device (device B) increased by 80% leading to considerable improvements in RF performance. Full article
(This article belongs to the Special Issue Gallium Nitride-Based Devices)
Show Figures

Figure 1

Back to TopTop