Selected papers from the 2020 IEEE International Worshop on Metrology for Industry 4.0 and IoT

Dear Colleagues,

The 2020 IEEE International Workshop on Metrology for Industry 4.0 and IoT (http://www.metroind40iot.org/home) will be held in Rome, Italy on 3–5 June 2020. Authors of papers presented at the workshop related to Sensors are invited to submit extended versions of their work to this Special Issue for publication.

MetroInd4.0&IoT aims to discuss the contributions of metrology for the development of Industry 4.0 and IoT and the new opportunities offered by Industry 4.0 and IoT for the development of new measurement methods and apparatuses. We aim to provide a platform to gather people who work in the development of instrumentation and measurement methods for Industry 4.0 and IoT. Particular areas of focus include, but are not limited to, new technology for metrology-assisted production in Industry 4.0 and IoT, Industry 4.0 and IoT component measurements, sensors and associated signal conditioning for Industry 4.0 and IoT, and calibration methods for electronic tests and measurement for Industry 4.0 and IoT.

Topics:

• industrial sensors;
• virtual sensors and sensor interfacing;
• IoT enabled sensors and measurement systems;
• measurement applications based on IoT;
• Industrial IoT, Factory of Things, and Internet of Things;
• Wireless sensor networks and IoT;
• Wearables and body sensor networks;
• sensors data management;
• localization technologies;

Dr. Carlo Massaroni
Dr. Lorenzo Scalise
Guest Editors

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