Development and Application of Advanced In Situ Microscopy and Spectroscopy Techniques for Functional Materials at the Nanoscale

Dear Colleagues,

The study of nanomaterials and devices at the nanoscale has become one of the most interesting and complex research fields from both basic and applied perspectives. In recent decades, the fundamental understanding of static and dynamic processes at the nanoscale has greatly improved, owing to innovative experiments and theoretical approaches. We have seen rapid progress in the development and applications of advanced microscopy and spectroscopy techniques for nanoscale material characterization with high spatial, temporal, and energetic resolutions. In particular, radiation-based (light, X-ray and electron) and probe-based (atomic-, pizeo-, and magentic-force) microscopy and spectroscopy techniques have made fast strides and thus attracted considerable research interest. Therefore, a timely summary and collections of the current status of different technologies and their respective applications of nano materials and devices will be highly valued.

This Special Issue aims to focus on the latest theoretical developments and practical applications of novel microscopy and spectroscopy techniques that have been successfully established and applied on various nanoscale materials and devices. We aim to attract both academic and industrial researchers in order to pool together the current knowledge of nanoscale characterization of nanomaterials and to present new ideas for future applications and new technologies for advancing nanomaterial research.

Prof. Dr. Zi'an Li
Prof. Dr. Ruibin Liu
Guest Editors

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