Special Issue "Nanoscale Imaging and Spectroscopy of Nanostructured Materials – Electron Microscopy and Beyond"

A special issue of Nanomaterials (ISSN 2079-4991).

Deadline for manuscript submissions: 25 February 2021.

Special Issue Editor

Prof. Dr. Jakob Birkedal Wagner
Guest Editor
Centre for Nanofabrication and Characterization, Technical University of Denmark, Fysikvej 307, 2800 Kgs. Lyngby, Denmark
Interests: high-resolution electron microscopy; energy-filtered imaging and in situ electron microscopy; characterization and in situ study of semiconductor nanowires; nanoparticle catalysts and low-contrast materials such as carbon nanotubes and graphene; particular interested in atomic scale imaging and spectroscopy of nanostructured materials response to the presence of gas and heat

Special Issue Information

Dear Colleagues,

It has become evident in recent years that nanotechnology is capable of producing materials that have properties that are not found in nature (at least on earth). In order to understand the macroscopic properties of materials, it is essential to gain an insight into the nature of the smallest building blocks, and here, nanoscale imaging research comes to the fore.

Nanoscale imaging research comes in many guises, but few are as versatile as electron microscopy. Probing nanoscale materials with high-energy electrons results in a plethora of different characterization possibilities. These include morphological and crystallographic information on the nanoscale, as well as elemental, chemical, and plasmonic mapping and responses. Furthermore, electron microscopy is also capable of mapping electric and magnetic fields at the nanoscale.

In situ electron microscopy, which describes the imaging and analysis of samples while they are exposed to external stimuli and environment, is a rapidly developing field. External stimuli include gas exposure, heat treatment, indentation, light exposure, electrical bias, fluid exposure, magnetization, etc.

Building a full laboratory in the confined space of an electron microscope without compromising the general performance of the instrument is an ongoing and necessary step towards moving electron microscopy from a technique providing aesthetically pleasing images to a characterization tool, which, together with complementary techniques, advances materials science research.

Prof. Jakob Birkedal Wagner
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Nanomaterials is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.


  • Electron microscopy
  • Nanostructures
  • Functional materials
  • Dynamics on the nanoscale
  • In situ

Published Papers

This special issue is now open for submission.
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