Special Issue "Nanoscale Imaging and Spectroscopy of Nanostructured Materials – Electron Microscopy and Beyond"
A special issue of Nanomaterials (ISSN 2079-4991).
Deadline for manuscript submissions: closed (25 February 2021) | Viewed by 2790
Interests: high-resolution electron microscopy; energy-filtered imaging and in situ electron microscopy; characterization and in situ study of semiconductor nanowires; nanoparticle catalysts and low-contrast materials such as carbon nanotubes and graphene; particular interested in atomic scale imaging and spectroscopy of nanostructured materials response to the presence of gas and heat
It has become evident in recent years that nanotechnology is capable of producing materials that have properties that are not found in nature (at least on earth). In order to understand the macroscopic properties of materials, it is essential to gain an insight into the nature of the smallest building blocks, and here, nanoscale imaging research comes to the fore.
Nanoscale imaging research comes in many guises, but few are as versatile as electron microscopy. Probing nanoscale materials with high-energy electrons results in a plethora of different characterization possibilities. These include morphological and crystallographic information on the nanoscale, as well as elemental, chemical, and plasmonic mapping and responses. Furthermore, electron microscopy is also capable of mapping electric and magnetic fields at the nanoscale.
In situ electron microscopy, which describes the imaging and analysis of samples while they are exposed to external stimuli and environment, is a rapidly developing field. External stimuli include gas exposure, heat treatment, indentation, light exposure, electrical bias, fluid exposure, magnetization, etc.
Building a full laboratory in the confined space of an electron microscope without compromising the general performance of the instrument is an ongoing and necessary step towards moving electron microscopy from a technique providing aesthetically pleasing images to a characterization tool, which, together with complementary techniques, advances materials science research.
Prof. Dr. Jakob Birkedal Wagner
Manuscript Submission Information
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- Electron microscopy
- Functional materials
- Dynamics on the nanoscale
- In situ