Nanoscale Microscopy Techniques for Energy Materials
A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Synthesis, Interfaces and Nanostructures".
Deadline for manuscript submissions: 30 April 2025 | Viewed by 1337
Special Issue Editors
Interests: transmission electron microscopy (TEM); scanning TEM (STEM); liquid and gas enviromental (S)TEM; in-situ and identical location (S)TEM for photocatalysts and electrocatalysts; electron holography; analytical (S)TEM
Special Issue Information
Dear Colleagues,
Nanoscale microscopy techniques such as transmission electron microscopy (TEM), scanning electron microscopy (SEM), scanning probe microscopy (SPM), and synchrotron-based beam microscopy represent increasingly powerful methods with which to understand the structure and chemistry of materials at the nanoscale. Based on the concept that the development of advanced energy materials can contribute to building a sustainable society, various kinds of materials for countermeasures against worldwide issues such as carbon emissions, environmental pollution, and limited resources have been developed by materials researchers and industries. Thus, research employing the above nanoscale microscopy techniques, especially for advanced energy materials, has become increasingly popular.
This Special Issue covers nanoscale microscopy techniques for energy materials and other relevant topics. Original research articles, review articles, and short communications concerning these are welcome.
We look forward to receiving your contributions.
Dr. Masaki Takeguchi
Guest Editor
Dr. Emi Kano
Guest Editor Assistant
Manuscript Submission Information
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Keywords
- TEM
- SEM
- SPM
- synchrotron-based microscopy
- nanoparticle
- thin film
- surface
- interface
- catalyst
- power semiconductor
- 2D material
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