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Special Issues
Resiliency, Robustness, and Reliability (R3) for VLSI Circuits and Systems
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Resiliency, Robustness, and Reliability (R3) for VLSI Circuits and Systems

A special issue of Journal of Low Power Electronics and Applications (ISSN 2079-9268).

Deadline for manuscript submissions: closed (28 February 2014) | Viewed by 19290

Special Issue Editors

Prof. Dr. Massimo Alioto

E-Mail Website
Guest Editor
Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583, Singapore
Interests: self-powered wireless integrated systems; near-threshold circuits for green computing; energy-quality scalable integrated systems; data-driven integrated systems; hardware-level security; emerging technologies
Prof. Dr. Paul Ampadu

E-Mail Website
Guest Editor
Department of Electrical and Computer Engineering, School of Engineering and Applied Sciences, University of Rochester, Rochester, MN, USA
Interests: energy-efficient VLSI design

Special Issue Information

Dear Colleagues,

Resiliency, robustness and reliability have become a major concern in the design of circuits and systems for computing, storage, and processing. These challenges will become even more critical in future generation VLSI circuits and systems. Simultaneously, the energy/performance/design effort cost of ensuring adequate yield and correctness over the whole chip lifespan is increasing rapidly, possibly offsetting the benefits of technology scaling.

This special issue focuses on circuit, system, and cross-layer techniques to deal with faults and errors introduced by inherent, transient or aging-related failures. Emphasis is given to the following challenges: (i) designing resilient/robust/reliable systems derived from unreliable components, (ii) reducing design margin and cost necessary to detect and correct failures, (iii) defining energy/performance-aware design strategies to handle failures in imperfect systems, (iv) developing low-cost yield-centric techniques that are amenable to further technology scaling, (v) developing approaches to reduce or tolerate device/circuit degradation over time, (vi) enhancing resiliency/robustness/reliability to enable aggressive energy/voltage reduction.

Scientific contributions are invited to address the above challenges. Topics of interest for this issue include, but are not limited to:

  • process/voltage/temperature variation-aware techniques for low-energy and/or high-performance applications
  • design-time and post-silicon approaches to enhance yield in nanoscale CMOS chips
  • adaptive/redundant/reconfigurable circuits, modules and systems to deal with defects and failures
  • low-overhead techniques for detection and correction of static/slow/fast errors
  • application-aware approaches for less-than perfect/approximate computing
  • innovative approaches to prolonging chip lifetime in spite of aging and other reliability issues
  • design exploration and automation with emphasis on resiliency, robustness and reliability
  • resiliency, robustness and reliability in beyond-CMOS technologies
  • issues related to reliable ultra-low voltage VLSI circuits and systems for green computing.

Dr. Massimo Alioto
Prof. Dr. Paul Ampadu
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Journal of Low Power Electronics and Applications is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1800 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

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Published Papers (2 papers)

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Research

990 KiB  
Article
Two-Layer Error Control Codes Combining Rectangular and Hamming Product Codes for Cache Error
by Meilin Zhang and Paul Ampadu
J. Low Power Electron. Appl. 2014, 4(1), 44-62; https://doi.org/10.3390/jlpea4010044 - 27 Feb 2014
Viewed by 9454
Abstract
We propose a novel two-layer error control code, combining error detection capability of rectangular codes and error correction capability of Hamming product codes in an efficient way, in order to increase cache error resilience for many core systems, while maintaining low power, area [...] Read more.
We propose a novel two-layer error control code, combining error detection capability of rectangular codes and error correction capability of Hamming product codes in an efficient way, in order to increase cache error resilience for many core systems, while maintaining low power, area and latency overhead. Based on the fact of low latency and overhead of rectangular codes and high error control capability of Hamming product codes, two-layer error control codes employ simple rectangular codes for each cache line to detect cache errors, while loading the extra Hamming product code checks bits in the case of error detection; thus enabling reliable large-scale cache operations. Analysis and experiments are conducted to evaluate the cache fault-tolerant capability of various existing solutions and the proposed approach. The results show that the proposed approach can significantly increase Mean-Error-To-Failure (METF) and Mean-Time-To-failure (MTTF) up to 2.8×, reduce storage overhead by over 57%, and increase instruction per-cycle (IPC) up to 7%, compared to complex four-way 4EC5ED; and it increases METF and MTTF up to 133×, reduces storage overhead by over 11%, and achieves a similar IPC compared to simple eight-way single-error correcting double-error detecting (SECDED). The cost of the proposed approach is no more than 4% external memory access overhead. Full article
(This article belongs to the Special Issue Resiliency, Robustness, and Reliability (R3) for VLSI Circuits and Systems)
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648 KiB  
Article
Multi-Threshold Dual-Spacer Dual-Rail Delay-Insensitive Logic (MTD3L): A Low Overhead Secure IC Design Methodology
by Michael Linder, Jia Di and Scott C. Smith
J. Low Power Electron. Appl. 2013, 3(4), 300-336; https://doi.org/10.3390/jlpea3040300 - 25 Oct 2013
Cited by 9 | Viewed by 8938
Abstract
As portable devices become more ubiquitous, data security in these devices is becoming increasingly important. Traditional circuit design techniques leave otherwise secure systems vulnerable due to the characteristics of the hardware implementation, rather than weaknesses in the security algorithms. These characteristics, called side-channels, [...] Read more.
As portable devices become more ubiquitous, data security in these devices is becoming increasingly important. Traditional circuit design techniques leave otherwise secure systems vulnerable due to the characteristics of the hardware implementation, rather than weaknesses in the security algorithms. These characteristics, called side-channels, are exploitable because they can be measured and correlated with processed data, potentially giving an attacker insight into the device’s secret data. Alternative design techniques such as dual-rail asynchronous designs are capable of minimizing these potential side-channels by decoupling them from the data being processed. However, these techniques are either expensive to implement compared to standard designs or leave exploitable imbalances in the dual-rail implementation itself. Multi-Threshold Dual-Spacer Dual-Rail Delay-Insensitive Logic (MTD3L) offers security by balancing side-channels both in general and between the dual-rail signals themselves, as well as reduction in circuit overhead compared to previous secure design techniques. Results show that the Advanced Encryption Standard (AES) cores designed using MTD3L exhibit similar security to previous secure techniques with substantially less area and energy overhead. Full article
(This article belongs to the Special Issue Resiliency, Robustness, and Reliability (R3) for VLSI Circuits and Systems)
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