Conferences

24–27 March 2014, Udine, Italy
27th International Conference on Microelectronic Test Structures

Topics:

-Characterization of new materials

-Replicated Feature Metrology

-Manufacturing of Integrated Circuits and  MEMS

-Nanotechnology, Displays and Emerging Devices

-Device and Circuit Modelling, Parameter Extraction

-Technology R&D and Integration

-Yield Enhancement, and Production Process Control

-Test Structure Measurement Utilisation Strategy

http://icmts2014.uniud.it/

Back to TopTop