Special Issue "Metrology in Manufacturing"
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Applied Industrial Technologies".
Deadline for manuscript submissions: closed (30 September 2021) | Viewed by 1963
Special Issue Editors
Interests: digital twin; visual measurement; intelligent manufacturing
Special Issues, Collections and Topics in MDPI journals
Prof. Dr. Edward Morse
Interests: large scale metrology; computational metrology; assembly modeling and analysis; geometric tolerancing and standards; computer aided manufacturing; model based enterprise
Special Issue Information
Dear Colleagues,
Metrology, the science of measurement, is undergoing significant development in the light of new challenges of precision manufacturing and digital transformation. Recent developments in complex products, novel materials, advanced manufacturing processes, and enhanced measurement systems lead to new challenges for metrology in manufacturing. The fundamental tasks of metrology in manufacturing regarding conformity assessment, process control, and quality assurance are subject to new demands driven by cost reduction, environmental impact, and new manufacturing infrastructures based on data, services, and the Industrial Internet of Things.
This Special Issue aims to present some of the recent research in manufacturing metrology covering both fundamental research and applications. We welcome state-of-the-art reviews, cross-disciplinary research fronts, and industrial applications to highlight the current advancements in manufacturing metrology.
Prof. Dr. Nabil Anwer
Prof. Dr. Edward Morse
Prof. Dr. Giovanni Moroni
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2300 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- In situ, in-process, and in-line measurements
- Advanced coordinate measuring systems
- Machine-tool metrology
- Robotic measurement and inspection
- Optical systems in dimensional metrology
- Computed tomography in dimensional metrology
- Multisensor measurement in dimensional metrology
- Cloud of points and geometry processing in dimensional metrology
- Metrology for additive manufacturing
- Metrology for process control and optimization
- Metrology systems and Industry 4.0
- Training and education aspects
