Methods and Architectures for Dependability of Embedded or Integrated Systems
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Electrical, Electronics and Communications Engineering".
Deadline for manuscript submissions: closed (31 December 2021) | Viewed by 3083
Special Issue Editor
Interests: integrated systems; computer architecture; VLSI design methods and CAD tools; dependability analysis; secure circuits; robust circuits; fault-tolerant architectures; concurrent checking; test
Special Issue Information
Dear Colleagues,
An increasing number of systems must today satisfy dependability constraints, encompassing in particular safety, availability, and/or security. These systems can be equipment assembling off-the-shelf components on printed circuit boards, often called embedded systems, or they can be integrated systems, often built from a set of functional blocks (IPs). Additionally, several constraints must today match together in many systems. As an example, critical electronic systems in cars have constraints about functional safety (ISO 26262) but also require security to avoid hacking. Similarly, SCADA equipment requires availability, but also security. Online test, fault tolerance, aging monitoring and dynamic adaptation, reconfiguration, and side channel mitigation are non-exhaustive examples of approaches used in this context.
This Special Issue looks for original papers presenting ways to improve and/or validate any dependability attribute of such systems, either at block level, circuit (integrated system) level or in electronic control units, used in many industrial contexts. Contributions are being sought on methods (methodology, algorithms, tools, etc.), descriptions of new or optimized hardware/software functions or building blocks (IPs), or real-life application demonstrations with optimized system-level assembling of existing blocks. Taking advantage of emerging technologies to improve dependability attributes is another possibility, as any new proposed direction in the global scope.
Prof. Régis Leveugle
Guest Editor
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Keywords
- online test
- fault tolerance
- dependable architectures
- aging mitigation
- emerging technologies for dependability
- embedded systems
- integrated systems
- circuit design
- dependability
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