Moreau, C.; Lemesle, J.; Berkmans, F.; Páez Margarit, D.; Carlier, T.; Blateyron, F.; Bigerelle, M.
Sdr as a Key Roughness Parameter for Monitoring the Temporal Stability of Measuring Instruments: Short- and Extended-Time Uncertainties. Metrology 2026, 6, 10.
https://doi.org/10.3390/metrology6010010
AMA Style
Moreau C, Lemesle J, Berkmans F, Páez Margarit D, Carlier T, Blateyron F, Bigerelle M.
Sdr as a Key Roughness Parameter for Monitoring the Temporal Stability of Measuring Instruments: Short- and Extended-Time Uncertainties. Metrology. 2026; 6(1):10.
https://doi.org/10.3390/metrology6010010
Chicago/Turabian Style
Moreau, Clément, Julie Lemesle, François Berkmans, David Páez Margarit, Thomas Carlier, François Blateyron, and Maxence Bigerelle.
2026. "Sdr as a Key Roughness Parameter for Monitoring the Temporal Stability of Measuring Instruments: Short- and Extended-Time Uncertainties" Metrology 6, no. 1: 10.
https://doi.org/10.3390/metrology6010010
APA Style
Moreau, C., Lemesle, J., Berkmans, F., Páez Margarit, D., Carlier, T., Blateyron, F., & Bigerelle, M.
(2026). Sdr as a Key Roughness Parameter for Monitoring the Temporal Stability of Measuring Instruments: Short- and Extended-Time Uncertainties. Metrology, 6(1), 10.
https://doi.org/10.3390/metrology6010010
