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Journal: Physchem, 2025
Volume: 5
Number: 10
Article:
Comprehensive Review of Wide-Bandgap (WBG) Devices: SiC MOSFET and Its Failure Modes Affecting Reliability
Authors:
by
Ghulam Akbar, Alessio Di Fatta, Giuseppe Rizzo, Guido Ala, Pietro Romano and Antonino Imburgia
Link:
https://www.mdpi.com/2673-7167/5/1/10
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