Dubey, P.; Miller, S.; Günay, E.E.; Jackman, J.; Kremer, G.E.; Kremer, P.A.
You Only Look Once v5 and Multi-Template Matching for Small-Crack Defect Detection on Metal Surfaces. Automation 2025, 6, 16.
https://doi.org/10.3390/automation6020016
AMA Style
Dubey P, Miller S, Günay EE, Jackman J, Kremer GE, Kremer PA.
You Only Look Once v5 and Multi-Template Matching for Small-Crack Defect Detection on Metal Surfaces. Automation. 2025; 6(2):16.
https://doi.org/10.3390/automation6020016
Chicago/Turabian Style
Dubey, Pallavi, Seth Miller, Elif Elçin Günay, John Jackman, Gül E. Kremer, and Paul A. Kremer.
2025. "You Only Look Once v5 and Multi-Template Matching for Small-Crack Defect Detection on Metal Surfaces" Automation 6, no. 2: 16.
https://doi.org/10.3390/automation6020016
APA Style
Dubey, P., Miller, S., Günay, E. E., Jackman, J., Kremer, G. E., & Kremer, P. A.
(2025). You Only Look Once v5 and Multi-Template Matching for Small-Crack Defect Detection on Metal Surfaces. Automation, 6(2), 16.
https://doi.org/10.3390/automation6020016