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Journal: Telecom, 2024
Volume: 5
Number: 35

Article: Measurement of Dielectric Properties of Thin Materials for Radomes Using Waveguide Cavities
Authors: by Tayla Dahms, Douglas B. Hayman, Bahare Mohamadzade and Stephanie L. Smith
Link: https://www.mdpi.com/2673-4001/5/3/35

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