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Journal: TelecomVolume: 5Number: 35
Article: Measurement of Dielectric Properties of Thin Materials for Radomes Using Waveguide Cavities
  • Authors:
  • Tayla Dahms1,*,
  • Douglas B. Hayman2 and
  • Bahare Mohamadzade2
  • et al.
Link: https://www.mdpi.com/2673-4001/5/3/35

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