Corrosion and Materials Degradation, Volume 6, Issue 4
2025 December - 22 articles
Cover Story: The knowledge of passive films spontaneously formed on metal surfaces is crucial for understanding metals’ corrosion resistance during their service life. X-ray photoelectron spectroscopy (XPS) is a commonly used technique for the analysis of passive films; however, it is limited to ultra-high vacuum conditions. Modern synchrotron X-ray sources offer unprecedented possibilities for detailed analyses of passive films, enabling in situ and operando studies of metals in gaseous, aqueous, and electrochemical environments. As demonstrated in this review, synchrotron-based XPS not only greatly improves probing sensitivity and spatial resolution but also reveals changes throughout the whole passive film and underlying alloy layer, as well as inhomogeneities in passive films associated with the complex microstructures of advanced industrial alloys. View this paper - Issues are regarded as officially published after their release is announced to the table of contents alert mailing list .
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