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Journal: CeramicsVolume: 5Number: 23
Article: FIB and Wedge Polishing Sample Preparation for TEM Analysis of Sol-Gel Derived Perovskite Thin Films
  • Authors:
  • Jorge Sanz-Mateo1,2,*,
  • Marco Deluca1 and
  • Bernhard Sartory1
  • et al.
Link: https://www.mdpi.com/2571-6131/5/3/23

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