Persano, A.; Tagliapietra, G.; Iannacci, J.; Bagolini, A.; Quaranta, F.; Siciliano, P.
Pull-In Voltage and Stress in Fixed-Fixed Beams of RF MEMS Switches. Proceedings 2024, 97, 174.
https://doi.org/10.3390/proceedings2024097174
AMA Style
Persano A, Tagliapietra G, Iannacci J, Bagolini A, Quaranta F, Siciliano P.
Pull-In Voltage and Stress in Fixed-Fixed Beams of RF MEMS Switches. Proceedings. 2024; 97(1):174.
https://doi.org/10.3390/proceedings2024097174
Chicago/Turabian Style
Persano, Anna, Girolamo Tagliapietra, Jacopo Iannacci, Alvise Bagolini, Fabio Quaranta, and Pietro Siciliano.
2024. "Pull-In Voltage and Stress in Fixed-Fixed Beams of RF MEMS Switches" Proceedings 97, no. 1: 174.
https://doi.org/10.3390/proceedings2024097174
APA Style
Persano, A., Tagliapietra, G., Iannacci, J., Bagolini, A., Quaranta, F., & Siciliano, P.
(2024). Pull-In Voltage and Stress in Fixed-Fixed Beams of RF MEMS Switches. Proceedings, 97(1), 174.
https://doi.org/10.3390/proceedings2024097174