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Journal: Cryptography, 2025
Volume: 9
Number: 36

Article: Reliability Improvement of 28 nm Intel FPGA Ring Oscillator PUF for Chip Identification
Authors: by Zulfikar Zulfikar, Hubbul Walidainy, Aulia Rahman and Kahlil Muchtar
Link: https://www.mdpi.com/2410-387X/9/2/36

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