Maerten, T.;                     Jaoul, C.;                     Oltra, R.;                     Duport, P.;                     Le Niniven, C.;                     Tristant, P.;                     Meunier, F.;                     Jarry, O.    
        Micrometric Growth Defects of DLC Thin Films. C 2019, 5, 73.
    https://doi.org/10.3390/c5040073
    AMA Style
    
                                Maerten T,                                 Jaoul C,                                 Oltra R,                                 Duport P,                                 Le Niniven C,                                 Tristant P,                                 Meunier F,                                 Jarry O.        
                Micrometric Growth Defects of DLC Thin Films. C. 2019; 5(4):73.
        https://doi.org/10.3390/c5040073
    
    Chicago/Turabian Style
    
                                Maerten, Thibault,                                 Cédric Jaoul,                                 Roland Oltra,                                 Patrice Duport,                                 Christophe Le Niniven,                                 Pascal Tristant,                                 Frédéric Meunier,                                 and Olivier Jarry.        
                2019. "Micrometric Growth Defects of DLC Thin Films" C 5, no. 4: 73.
        https://doi.org/10.3390/c5040073
    
    APA Style
    
                                Maerten, T.,                                 Jaoul, C.,                                 Oltra, R.,                                 Duport, P.,                                 Le Niniven, C.,                                 Tristant, P.,                                 Meunier, F.,                                 & Jarry, O.        
        
        (2019). Micrometric Growth Defects of DLC Thin Films. C, 5(4), 73.
        https://doi.org/10.3390/c5040073