Zhao, L.; Zang, Z.; Zhang, S.; Chen, Y.; Zheng, Y.; Niu, Z.; Yu, J.; Luo, W.; Li, Z.; Kong, M.;
et al. Accuracy Analysis of Measuring Cylindrical Surfaces with Complex Parameters Using Two-Dimensional Pseudo Lateral Shearing Interferometry. Photonics 2025, 12, 1059.
https://doi.org/10.3390/photonics12111059
AMA Style
Zhao L, Zang Z, Zhang S, Chen Y, Zheng Y, Niu Z, Yu J, Luo W, Li Z, Kong M,
et al. Accuracy Analysis of Measuring Cylindrical Surfaces with Complex Parameters Using Two-Dimensional Pseudo Lateral Shearing Interferometry. Photonics. 2025; 12(11):1059.
https://doi.org/10.3390/photonics12111059
Chicago/Turabian Style
Zhao, Le, Zhongming Zang, Siqi Zhang, Yang Chen, Yueqing Zheng, Zhitian Niu, Jing Yu, Weizhou Luo, Zhu Li, Ming Kong,
and et al. 2025. "Accuracy Analysis of Measuring Cylindrical Surfaces with Complex Parameters Using Two-Dimensional Pseudo Lateral Shearing Interferometry" Photonics 12, no. 11: 1059.
https://doi.org/10.3390/photonics12111059
APA Style
Zhao, L., Zang, Z., Zhang, S., Chen, Y., Zheng, Y., Niu, Z., Yu, J., Luo, W., Li, Z., Kong, M., Wang, S., & Hai, K.
(2025). Accuracy Analysis of Measuring Cylindrical Surfaces with Complex Parameters Using Two-Dimensional Pseudo Lateral Shearing Interferometry. Photonics, 12(11), 1059.
https://doi.org/10.3390/photonics12111059
