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Journal: MathematicsVolume: 8Number: 217
Article: Robust Linear Trend Test for Low-Coverage Next-Generation Sequence Data Controlling for Covariates
  • Authors:
  • Jung Yeon Lee1,
  • Myeong-Kyu Kim2 and
  • Wonkuk Kim3,*
Link: https://www.mdpi.com/2227-7390/8/2/217

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