Bar-Lev, S.K.;                     Batsidis, A.;                     Einbeck, J.;                     Liu, X.;                     Ren, P.    
        Cumulant-Based Goodness-of-Fit Tests for the Tweedie, Bar-Lev and Enis Class of Distributions. Mathematics 2023, 11, 1603.
    https://doi.org/10.3390/math11071603
    AMA Style
    
                                Bar-Lev SK,                                 Batsidis A,                                 Einbeck J,                                 Liu X,                                 Ren P.        
                Cumulant-Based Goodness-of-Fit Tests for the Tweedie, Bar-Lev and Enis Class of Distributions. Mathematics. 2023; 11(7):1603.
        https://doi.org/10.3390/math11071603
    
    Chicago/Turabian Style
    
                                Bar-Lev, Shaul K.,                                 Apostolos Batsidis,                                 Jochen Einbeck,                                 Xu Liu,                                 and Panpan Ren.        
                2023. "Cumulant-Based Goodness-of-Fit Tests for the Tweedie, Bar-Lev and Enis Class of Distributions" Mathematics 11, no. 7: 1603.
        https://doi.org/10.3390/math11071603
    
    APA Style
    
                                Bar-Lev, S. K.,                                 Batsidis, A.,                                 Einbeck, J.,                                 Liu, X.,                                 & Ren, P.        
        
        (2023). Cumulant-Based Goodness-of-Fit Tests for the Tweedie, Bar-Lev and Enis Class of Distributions. Mathematics, 11(7), 1603.
        https://doi.org/10.3390/math11071603