Bar-Lev, S.K.; Batsidis, A.; Einbeck, J.; Liu, X.; Ren, P.
Cumulant-Based Goodness-of-Fit Tests for the Tweedie, Bar-Lev and Enis Class of Distributions. Mathematics 2023, 11, 1603.
https://doi.org/10.3390/math11071603
AMA Style
Bar-Lev SK, Batsidis A, Einbeck J, Liu X, Ren P.
Cumulant-Based Goodness-of-Fit Tests for the Tweedie, Bar-Lev and Enis Class of Distributions. Mathematics. 2023; 11(7):1603.
https://doi.org/10.3390/math11071603
Chicago/Turabian Style
Bar-Lev, Shaul K., Apostolos Batsidis, Jochen Einbeck, Xu Liu, and Panpan Ren.
2023. "Cumulant-Based Goodness-of-Fit Tests for the Tweedie, Bar-Lev and Enis Class of Distributions" Mathematics 11, no. 7: 1603.
https://doi.org/10.3390/math11071603
APA Style
Bar-Lev, S. K., Batsidis, A., Einbeck, J., Liu, X., & Ren, P.
(2023). Cumulant-Based Goodness-of-Fit Tests for the Tweedie, Bar-Lev and Enis Class of Distributions. Mathematics, 11(7), 1603.
https://doi.org/10.3390/math11071603