Liu, Q.; Sun, T.; Wen, X.; Zeng, M.; Chen, J.
Detecting the Minimum Limit on Wheat Stripe Rust in the Latent Period Using Proximal Remote Sensing Coupled with Duplex Real-Time PCR and Machine Learning. Plants 2023, 12, 2814.
https://doi.org/10.3390/plants12152814
AMA Style
Liu Q, Sun T, Wen X, Zeng M, Chen J.
Detecting the Minimum Limit on Wheat Stripe Rust in the Latent Period Using Proximal Remote Sensing Coupled with Duplex Real-Time PCR and Machine Learning. Plants. 2023; 12(15):2814.
https://doi.org/10.3390/plants12152814
Chicago/Turabian Style
Liu, Qi, Tingting Sun, Xiaojie Wen, Minghao Zeng, and Jing Chen.
2023. "Detecting the Minimum Limit on Wheat Stripe Rust in the Latent Period Using Proximal Remote Sensing Coupled with Duplex Real-Time PCR and Machine Learning" Plants 12, no. 15: 2814.
https://doi.org/10.3390/plants12152814
APA Style
Liu, Q., Sun, T., Wen, X., Zeng, M., & Chen, J.
(2023). Detecting the Minimum Limit on Wheat Stripe Rust in the Latent Period Using Proximal Remote Sensing Coupled with Duplex Real-Time PCR and Machine Learning. Plants, 12(15), 2814.
https://doi.org/10.3390/plants12152814