Zhao, P.; Liu, T.; Cai, C.; He, Z.; Li, D.; Liu, J.
Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs. Electronics 2020, 9, 1230.
https://doi.org/10.3390/electronics9081230
AMA Style
Zhao P, Liu T, Cai C, He Z, Li D, Liu J.
Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs. Electronics. 2020; 9(8):1230.
https://doi.org/10.3390/electronics9081230
Chicago/Turabian Style
Zhao, Peixiong, Tianqi Liu, Chang Cai, Ze He, Dongqing Li, and Jie Liu.
2020. "Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs" Electronics 9, no. 8: 1230.
https://doi.org/10.3390/electronics9081230
APA Style
Zhao, P., Liu, T., Cai, C., He, Z., Li, D., & Liu, J.
(2020). Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs. Electronics, 9(8), 1230.
https://doi.org/10.3390/electronics9081230