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Journal: Electronics, 2020
Volume: 9
Number: 2025

Article: Thermal Stress Reduction of Power MOSFET with Dynamic Gate Voltage Control and Circulation Current Injection in Electric Drive Application
Authors: by Lie Wang, Bas Vermulst, Jorge Duarte and Henk Huisman
Link: https://www.mdpi.com/2079-9292/9/12/2025

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