Tiwari, K.A.; Raisutis, R.; Tumsys, O.; Ostreika, A.; Jankauskas, K.; Jakutavicius, J.
Defect Estimation in Non-Destructive Testing of Composites by Ultrasonic Guided Waves and Image Processing. Electronics 2019, 8, 315.
https://doi.org/10.3390/electronics8030315
AMA Style
Tiwari KA, Raisutis R, Tumsys O, Ostreika A, Jankauskas K, Jakutavicius J.
Defect Estimation in Non-Destructive Testing of Composites by Ultrasonic Guided Waves and Image Processing. Electronics. 2019; 8(3):315.
https://doi.org/10.3390/electronics8030315
Chicago/Turabian Style
Tiwari, Kumar Anubhav, Renaldas Raisutis, Olgirdas Tumsys, Armantas Ostreika, Kestutis Jankauskas, and Julijus Jakutavicius.
2019. "Defect Estimation in Non-Destructive Testing of Composites by Ultrasonic Guided Waves and Image Processing" Electronics 8, no. 3: 315.
https://doi.org/10.3390/electronics8030315
APA Style
Tiwari, K. A., Raisutis, R., Tumsys, O., Ostreika, A., Jankauskas, K., & Jakutavicius, J.
(2019). Defect Estimation in Non-Destructive Testing of Composites by Ultrasonic Guided Waves and Image Processing. Electronics, 8(3), 315.
https://doi.org/10.3390/electronics8030315