Order Article Reprints

Cai C, Gao S, Zhao P, Yu J, Zhao K, Xu L, Li D, He Z, Yang G, Liu T, et al. SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA. Electronics. 2019; 8(12):1531. https://doi.org/10.3390/electronics8121531

Cai, Chang, Shuai Gao, Peixiong Zhao, Jian Yu, Kai Zhao, Liewei Xu, Dongqing Li, Ze He, Guangwen Yang, Tianqi Liu, and et al. 2019. "SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA" Electronics 8, no. 12: 1531. https://doi.org/10.3390/electronics8121531

Cai, C., Gao, S., Zhao, P., Yu, J., Zhao, K., Xu, L., Li, D., He, Z., Yang, G., Liu, T., & Liu, J. (2019). SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA. Electronics, 8(12), 1531. https://doi.org/10.3390/electronics8121531