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Electronics2025, 14(5), 1022;https://doi.org/10.3390/electronics14051022

Journal: ElectronicsVolume: 14Number: 1022

Article: Equivalence Study of Single-Event Effects in Silicon Carbon Metal-Oxide Semiconductor Field-Effect Transistors by Protons and Heavy Ions

Authors:
Cuicui Liu^1,2,
Gang Guo^1,2,* and
Huilin Shi¹
et al.

Link: https://www.mdpi.com/2079-9292/14/5/1022

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