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Journal: Electronics, 2025
Volume: 14
Number: 1022

Article: Equivalence Study of Single-Event Effects in Silicon Carbon Metal-Oxide Semiconductor Field-Effect Transistors by Protons and Heavy Ions
Authors: by Cuicui Liu, Gang Guo, Huilin Shi, Zheng Zhang, Futang Li, Jinhua Han and Yanwen Zhang
Link: https://www.mdpi.com/2079-9292/14/5/1022

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