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Electronics2025, 14(2), 313;https://doi.org/10.3390/electronics14020313

Journal: ElectronicsVolume: 14Number: 313

Article: TCAD-Based Analysis on the Impact of AlN Interlayer in Normally-off AlGaN/GaN MISHEMTs with Buried p-Region

Authors:
Saleem Hamady^1,*,
Bilal Beydoun^2,3 and
Frédéric Morancho⁴

Link: https://www.mdpi.com/2079-9292/14/2/313

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