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Journal: Electronics, 2025
Volume: 14
Number: 313
Article:
TCAD-Based Analysis on the Impact of AlN Interlayer in Normally-off AlGaN/GaN MISHEMTs with Buried p-Region
Authors:
by
Saleem Hamady, Bilal Beydoun and Frédéric Morancho
Link:
https://www.mdpi.com/2079-9292/14/2/313
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