Jaradat, S.; Elhenawy, M.; Paz, A.; Alhadidi, T.I.; Ashqar, H.I.; Nayak, R.
A Cross-Cultural Crash Pattern Analysis in the United States and Jordan Using BERT and SHAP. Electronics 2025, 14, 272.
https://doi.org/10.3390/electronics14020272
AMA Style
Jaradat S, Elhenawy M, Paz A, Alhadidi TI, Ashqar HI, Nayak R.
A Cross-Cultural Crash Pattern Analysis in the United States and Jordan Using BERT and SHAP. Electronics. 2025; 14(2):272.
https://doi.org/10.3390/electronics14020272
Chicago/Turabian Style
Jaradat, Shadi, Mohammed Elhenawy, Alexander Paz, Taqwa I. Alhadidi, Huthaifa I. Ashqar, and Richi Nayak.
2025. "A Cross-Cultural Crash Pattern Analysis in the United States and Jordan Using BERT and SHAP" Electronics 14, no. 2: 272.
https://doi.org/10.3390/electronics14020272
APA Style
Jaradat, S., Elhenawy, M., Paz, A., Alhadidi, T. I., Ashqar, H. I., & Nayak, R.
(2025). A Cross-Cultural Crash Pattern Analysis in the United States and Jordan Using BERT and SHAP. Electronics, 14(2), 272.
https://doi.org/10.3390/electronics14020272