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Journal: Electronics, 2025
Volume: 14
Number: 3912
Article:
Analysis of Latent Defect Detection Using Sigma Deviation Count Labeling (SDCL)
Authors:
by
Yun-su Koo, Woo-chang Shin, Ha-je Park, Hee-yeong Yang and Choon-sung Nam
Link:
https://www.mdpi.com/2079-9292/14/19/3912
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