Wang, B.; Khan, I.; White, M.; Beloff, N.
Federated Learning for XSS Detection: Analysing OOD, Non-IID Challenges, and Embedding Sensitivity. Electronics 2025, 14, 3483.
https://doi.org/10.3390/electronics14173483
AMA Style
Wang B, Khan I, White M, Beloff N.
Federated Learning for XSS Detection: Analysing OOD, Non-IID Challenges, and Embedding Sensitivity. Electronics. 2025; 14(17):3483.
https://doi.org/10.3390/electronics14173483
Chicago/Turabian Style
Wang, Bo, Imran Khan, Martin White, and Natalia Beloff.
2025. "Federated Learning for XSS Detection: Analysing OOD, Non-IID Challenges, and Embedding Sensitivity" Electronics 14, no. 17: 3483.
https://doi.org/10.3390/electronics14173483
APA Style
Wang, B., Khan, I., White, M., & Beloff, N.
(2025). Federated Learning for XSS Detection: Analysing OOD, Non-IID Challenges, and Embedding Sensitivity. Electronics, 14(17), 3483.
https://doi.org/10.3390/electronics14173483